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Showing 1 - 2 of 2 Results
1.
Low-Power High-Resolution Analog to Digital Converters : Design, Test and Calibration
Low-Power High-Resolution Analog to Digital Converters : Design, Test and Calibration by Zjajo, Amir, Pineda de Gyve... ISBN: 9789048197248 List Price: $129.00
$52.33 (Save 59%)
2.
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing) by Sachdev, Manoj, Pineda de G... ISBN: 9781441942852 List Price: $139.00
$200.78